Quantitative Microscopy and Image Analysis: Conference Proceedings - Couverture rigide

Couverture rigide

ISBN 10 : 0871705117 ISBN 13 : 9780871705112

Editeur : ASM International, 1994

Synopsis

Sponsored by Materials Characterization Committee of Materials Testing and Quality Control Division ASM Publication More precise data for quality control Accurate analysis of complex images Relationship between ultrasonic and metallographic measurements Correlation between 2- and 3- dimensional distributions. Sixteen selected papers examine theories, concepts and recent advances which will help you fill the need for more precise quality control and microstructure evaluation data through automatic image analysis. Computer-aided techniques now allow you to make fast, accurate quantification of morphological features recorded through optical metallography and scanning electron/transmission electron microscopy. Learn how accurate, reproducible measurements are being made from complex images which were previously difficult to analyze. Visual assessment of global properties and correlation with ultrasonic measurements are discussed. Subjects include: Mathematical Morphology Processing, Scanning Probe Microscopy, Infrared Sensing of Weld Penetration, Stereology of Anisotropic Microstructures Digital X-Ray Mapping.

Détails de l'édition

• Éditeur: ASM International
• Date d'édition: 1994
• Langue: anglais
• ISBN 10: 0871705117
• ISBN 13: 9780871705112
• Reliure: Relié
• Nombre de pages: 135
• Éditeur: Diaz David J.
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible