Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee. Contents: Submicron Defect Analysis Failure Analysis of Microelectromechanical Systems (MEMS) Leading Edge Circuit Board Fault Localization/Failure Analysis Failure Analysis of Passive Components/Hybrid Components List of Microelectronic Failure Analysis Acronyms (updated) Key Word Index to ISTFA proceedings and to the Microelectronic Failure Analysis Desk Reference, 4th Edition (updated).
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
paperback. Etat : Very Good. Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book. N° de réf. du vendeur ERICA82908717076915
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