Optical characterization techniques for semiconductor technology: April 1-2, 1981, San Jose, California (Proceedings of the Society of Photo-optical Instrumentation Engineers) - Couverture souple
Résultats de recherche pour Optical characterization techniques for semiconductor...
Image d'archives
Optical Characterization Techniques for Semiconductor Technology: Volume 276. Proceedings of SPIE; 1-2 April 1981, San Jose, California
Edité par
SPIE PRESS-The International Society for Optical Engineering, Bellingham, WA, U.S.A., 1981
ISBN 10 : 0892523093
ISBN 13 : 9780892523092
Ancien ou d'occasion
Paperback
Edition originale
Vendeur : SUNSET BOOKS 2, Newark, OH, Etats-Unis
Évaluation du vendeur 4 sur 5 étoiles
Paperback. Etat : Very Good. No Jacket. 1st. Seller's image, know what you are getting! Pre-packing weight is 1 lb. 2.8 oz . ORIGINAL, NOT A REPRINT OR PHOTOCOPY!! NO Dust Jacket. Has or May Have all standard Library markings, pocket, labels, stamps, wear and soil to covers. CLEAN TEXT! See Picture! The Copyright date is 1981 for this Printing. This volume was purchased through DMRO from the Wright-Patterson Technical Library in the late 1990's. Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!! SEE PICTURES!!!!! ANY ODD/GREEN TONES ON THE SCANS ARE CAUSED BY MY SCANNER!! All of our Technical/Textbook/Ex-Library volumes were obtained legally through Public or Auction sales. Size: 4to Size: 4to - over 9¾ - 12" tall. Ex-Library. N° de réf. du vendeur 015975
Acheter D'occasion
EUR 10,49
Expédition à EUR 4,67
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
Quantité disponible : 1 disponible(s)