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Measurement and Effects of Surface Defects and Quality of Polish: Volume 525. Proceedings of SPIE; 21-22 January 1985, Los Angeles, California
Edité par
SPIE PRESS-The International Society for Optical Engineering, Bellingham, WA, U.S.A., 1985
ISBN 10 : 0892525606
ISBN 13 : 9780892525607
Ancien ou d'occasion
Paperback
Edition originale
Vendeur : SUNSET BOOKS 2, Newark, OH, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Paperback. Etat : Very Good. No Jacket. 1st. Seller's image, know what you are getting! Pre-packing weight is 2 lb. ? oz . ORIGINAL, NOT A REPRINT OR PHOTOCOPY!! NO Dust Jacket. Has or May Have all standard Library markings, pocket, labels, stamps, wear and soil to covers. CLEAN TEXT! See Picture! The Copyright date is 1985 for this Printing. This volume was purchased through DMRO from the Wright-Patterson Technical Library in the late 1990's. EXTRA MEDIA MAIL SHIPPING WOULD BE REQUIRED BUT WILL NOT BE COLLECTED AS $1.00 OF PRICE IS FOR EXTRA POSTAGE! So it will ship at the One Book rate. Please consider this when comparing pricing! Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!! SEE PICTURES!!!!! ANY ODD/GREEN TONES ON THE SCANS ARE CAUSED BY MY SCANNER!! All of our Technical/Textbook/Ex-Library volumes were obtained legally through Public or Auction sales. Size: 4to. Ex-Library. N° de réf. du vendeur 015990
Acheter D'occasion
EUR 22,13
Expédition à EUR 6,23
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
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