Articles liés à Vlsi Fault Modeling and Testing Techniques

Vlsi Fault Modeling and Testing Techniques - Couverture rigide

 
9780893917814: Vlsi Fault Modeling and Testing Techniques
Couverture rigide
ISBN 10 : 0893917818 ISBN 13 : 9780893917814
Editeur : Praeger Publishers Inc, 1993

Synopsis

VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking geometry of ICs. BIST PLA schemes have common features-controllability and observability - which are enhanced through additional logic and test points. Certain circuit topologies are more easily testable than others. The amount of reconvergent fan-out is a critical factor in determining realistic measures for determining test generation difficulty. Test implementation is usually left until after the VLSI data path has been synthesized into a structural description. This leads to investigation methodologies for performing design synthesis with test incorporation. These topics and more are discussed.

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À propos de l'auteur

brist /f George /i W.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Praeger Publishers Inc
Date d'édition
1993
Langue
anglais
ISBN 10 
0893917818
ISBN 13 
9780893917814
Reliure
Relié
Nombre de pages
200
Éditeur
Zobrist George W.
Coordonnées du fabricant
non disponible
Personne responsable
gpsr@libri.de
gpsr@libri.de

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