Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A - Couverture rigide

Johnson, Noble M.; Bishop, Stephen G.; Watkins, George D.

9780931837111: Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A

Couverture rigide

ISBN 10 : 0931837111 ISBN 13 : 9780931837111

Editeur : Materials Research Society, 1985

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�diteur: Materials Research Society
Date d'�dition: 1985
Langue: anglais
ISBN 10: 0931837111
ISBN 13: 9780931837111
Reliure: Reli�
Coordonn�es du fabricant: non disponible
Personne responsable: non disponible

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Microscopic Identification of Electronic Defects in Semiconductors (Materials Research Society Symposia Proceedings, Volume 46)

Johnson, Noble M., Stephen G. Bishop, and George D. Watkins, editors

Edit� par Materials Research Society, 1985

ISBN 10 : 0931837111 ISBN 13 : 9780931837111

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Hardcover. Etat : UsedGood. Hardcover; symposium held April 15-18, 1985, in San Francisco; fading and shelf wear to exterior; binding slightly cocked; scrape to side edge of front cover; note written on table of contents page, otherwise text is clean; former owner's stamping inside rear board; contents in good condition. N� de r�f. du vendeur 64117

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