Properties of Crystalline Materials by X-ray Diffraction Methods and Symmetry Groups - Couverture rigide

Mesa, John Fernando Zapata

 
9781032382371: Properties of Crystalline Materials by X-ray Diffraction Methods and Symmetry Groups
Couverture rigide
ISBN 10 : 1032382376 ISBN 13 : 9781032382371
Editeur : CRC Press, 2025

Synopsis

This book is a fundamental work for those seeking to understand the structure and properties of crystalline materials from a rigorous and systematic approach. Its coverage, which ranges from the physical principles of X-rays to structural refinement using the Rietveld method, provides a solid theoretical and practical foundation. The inclusion of symmetry group analysis and the study of elasticity reinforce its value in areas such as electronics and engineering. With an educational and precise approach, this work becomes an indispensable reference for materials characterization.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

À propos de l'auteur

John Fernando Zapata Mesa has a B.Sc. in theoretical physics, an M.Sc. in elementary particle physics, and a Ph.D. in materials engineering. He completed his postdoctoral stay in quantum mechanics, addressing the problem of quantum confinement in semiconductor heterostructures. He obtained all degrees at the University of Antioquia, Medellín, Colombia. He has been working at the University of Envigado for 17 years and is a full professor attached to the Faculty of Engineering.

His most recent research deals with the characterization of cementitious materials, the study of confinement in semiconductor heterostructures, and the modeling and simulation of physical phenomena at the macro and microstructure level and at the quantum level. Now he focuses on the study of the properties of materials from the study of their symmetries in the case of crystalline materials and methods of quantification of the amorphous phase in non-crystalline materials. For this purpose, he uses artificial intelligence tools, and tools such as the modified Rietveld method, FTIR modeling and Raman spectroscopy complemented with thermal analysis methods such as DSC and TGA techniques.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
CRC Press
Date d'édition
2025
Langue
anglais
ISBN 10 
1032382376
ISBN 13 
9781032382371
Reliure
Relié
Nombre de pages
314
Coordonnées du fabricant
non disponible
Personne responsable
gpsr@libri.de
gpsr@libri.de

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