Advances in Materials Problem Solving with the Electron Microscope - Couverture souple

Bentley, Jim

 
9781107413351: Advances in Materials Problem Solving with the Electron Microscope

Synopsis

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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Présentation de l'éditeur

This book was motivated by the remarkable advances that continue to be made in electron microscope instrumentation and techniques for applications to materials science. Advances include quantitative high-resolution imaging, atomic-resolution Z-contrast imaging, elemental mapping by energy-filtered TEM or spectrum imaging, atomic resolution EELS for composition and bonding, quantitative CBED, site- occupancy determination by ALCHEMI, electron holography, EBSP in the SEM for phase identification and orientation imaging microscopy, low-voltage microanalysis of bulk specimens, and in situ experiments of dynamic phenomena. The book emphasizes how these recent developments in electron microscopy are being used to solve materials problems. It features different groups of materials or microstructural components rather than electron microscope techniques or instrumentation. Papers focus on low-energy electron microscopy of surfaces, crystallography, defects, specimen preparation, and interfaces in metals and ceramics. Technological applications include magnetic materials, microelectronic materials, partially ordered and nanophase materials, polymers, ceramics, metallic alloys, concrete, biomaterials, and glasses.

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Autres éditions populaires du même titre

9781558994973: Advances in Materials Problem Solving with the Electron Microscope: Volume 589

Edition présentée

ISBN 10 :  1558994971 ISBN 13 :  9781558994973
Editeur : Cambridge University Press, 2000
Couverture rigide