Characterization and Measurement of Passive and Active Metamaterial Devices - Couverture souple

Lundell, Christopher A

 
9781249594987: Characterization and Measurement of Passive and Active Metamaterial Devices
Couverture souple
ISBN 10 : 1249594987 ISBN 13 : 9781249594987
Editeur : Biblioscholar, 2012

Synopsis

This document addresses two major obstacles facing metamaterial development: uncertainty in the characterization of electromagnetic field behavior in metamaterial structures and the relatively small operational bandwidth of metamaterial structures. To address the first obstacle, a new method to characterize electromagnetic field behavior in a metamaterial is presented. This new method is a bistatic radar cross section (RCS) measurement technique. RCS measurements are well-suited to measuring bulk metamaterial samples because they show frequency dependence of scattering angles and offer common postprocessing techniques that can be useful for visualizing results.

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Éditeur
Biblioscholar
Date d'édition
2012
Langue
anglais
ISBN 10 
1249594987
ISBN 13 
9781249594987
Reliure
Broché
Nombre de pages
244
Coordonnées du fabricant
non disponible
Personne responsable
non disponible