Nuclear Ambush: The Test Ban Trap - Couverture rigide

Voss, Earl H

Couverture rigide

ISBN 10 : 1258766876 ISBN 13 : 9781258766870

Editeur : Literary Licensing, LLC, 2013

Synopsis

Nuclear Ambush: The Test Ban Trap is a book written by Earl H. Voss. The book provides an in-depth analysis of the history of nuclear testing and the events that led to the Comprehensive Test Ban Treaty (CTBT) of 1996. The author argues that the CTBT was a trap that the United States fell into, as it was not in the country's best interest to sign the treaty. Voss describes the political and military implications of the treaty, including the impact on national security and the potential for other countries to cheat on the treaty. The book also examines the role of the United Nations and the International Atomic Energy Agency in the development of the CTBT. Nuclear Ambush: The Test Ban Trap is a thought-provoking and informative read for anyone interested in the history of nuclear testing and the politics of disarmament.This scarce antiquarian book is a facsimile reprint of the old original and may contain some imperfections such as library marks and notations. Because we believe this work is culturally important, we have made it available as part of our commitment for protecting, preserving, and promoting the world's literature in affordable, high quality, modern editions, that are true to their original work.

Détails de l'édition

• Éditeur: Literary Licensing, LLC
• Date d'édition: 2013
• Langue: anglais
• ISBN 10: 1258766876
• ISBN 13: 9781258766870
• Reliure: Relié
• Nombre de pages: 640
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible