Vendeur : California Books, Miami, FL, Etats-Unis
Etat : New. N° de réf. du vendeur I-9781288315918
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Vendeur : PBShop.store UK, Fairford, GLOS, Royaume-Uni
PAP. Etat : New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. N° de réf. du vendeur L0-9781288315918
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Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Etat : New. In. N° de réf. du vendeur ria9781288315918_new
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Vendeur : Books Puddle, New York, NY, Etats-Unis
Etat : New. pp. 148. N° de réf. du vendeur 26390601335
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Vendeur : moluna, Greven, Allemagne
Etat : New. KlappentextrnrnThe study of a system s reliability has played a crucial role in business and industry since the dawn of modern technology. Current graphical models utilized in reliability theory are limited in that no one model or technique allo. N° de réf. du vendeur 6555064
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Vendeur : Majestic Books, Hounslow, Royaume-Uni
Etat : New. Print on Demand pp. 148. N° de réf. du vendeur 390047144
Quantité disponible : 4 disponible(s)
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
Etat : New. PRINT ON DEMAND pp. 148. N° de réf. du vendeur 18390601341
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Taschenbuch. Etat : Neu. Neuware - The study of a system's reliability has played a crucial role in business and industry since the dawn of modern technology. Current graphical models utilized in reliability theory are limited in that no one model or technique allows for a thorough analysis of system reliability. This research introduces a new graphical model and methodology to be used in the field of reliability that addresses this concern. Event Occurrence Networks (EONs) and their solution methodologies provide an all-inclusive graphical model that allows for the manipulation of several important reliability measures. An EON is a probabilistic network that represents the superposition of several terminating counting processes and is an efficient tool in both non-repairable and repairable systems. Current methodologies are also restricted in the distributions that characterize component life and repair times. This concern is alleviated via EONs coupled with piecewise polynomial approximation. N° de réf. du vendeur 9781288315918
Quantité disponible : 2 disponible(s)
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
Paperback. Etat : Like New. Like New. book. N° de réf. du vendeur ERICA79612883159106
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