A Fortran Program for Analysis of Ellipsometer Measurements and Calculation of Reflection Coefficients From Thin Films (Classic Reprint) - Couverture souple
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A Fortran Program for Analysis of Ellipsometer Measurements and Calculation of
impression à la demandeVendeur : Forgotten Books, London, Royaume-Uni
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Paperback. Etat : New. Print on Demand. This book presents a detailed guide to the use of a FORTRAN computer program for the analysis of ellipsometer measurements and the calculation of reflection coefficients from thin films. The program can be used to determine the optical constants of thin films, including the refractive index and thickness, as well as the complex reflection coefficients for both single and multiple thin films. The book includes a detailed description of the program, including the input and output formats, and provides examples of how to use the program to perform various types of calculations. It also includes a discussion of the theory of ellipsometry and the optical properties of thin films. The book is a valuable resource for scientists and engineers who work with thin films and ellipsometry. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. N° de réf. du vendeur 9781390449723_0
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Expédition depuis Royaume-Uni vers Etats-Unis
Expédition depuis Royaume-Uni vers Etats-Unis
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