Design for Manufacturability And Yield for Nano-Scale Cmos - Couverture rigide

Chiang, Charles; Kawa, Jamil

Couverture rigide

ISBN 10 : 1402051875 ISBN 13 : 9781402051876

Editeur : Springer-Verlag New York Inc., 2007

Synopsis

Manufacturability and yield are no longer a fabrication, packaging, and test concerns. They are aspects that have to be designed in, and they are everybody's responsibility. Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, and through statistical timing closure of the design. It alerts the designer to the pitfalls to watch for and to the good practices that can enhance a design's manufacturability and yield. A must read book for the serious designer.

A propos du livre

À propos de l?auteur

Dr. Charles Chiang is R&D Director of the Advanced Technology Group at Synopsys Inc. in Mountain View, CA, USA

Détails de l'édition

• Éditeur: Springer-Verlag New York Inc.
• Date d'édition: 2007
• Langue: anglais
• ISBN 10: 1402051875
• ISBN 13: 9781402051876
• Reliure: Relié
• Nombre de pages: 282
• Coordonnées du fabricant: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Allemagne