Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - Couverture souple

Foster, Adam; Hofer, Werner A.

Couverture souple

ISBN 10 : 1441923063 ISBN 13 : 9781441923066

Editeur : Springer, 2010

Synopsis

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.

 

Key Features

• Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy
• Provides a framework for linking scanning probe theory and simulations with experimental data
• Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations

Détails de l'édition

• Éditeur: Springer
• Date d'édition: 2010
• Langue: anglais
• ISBN 10: 1441923063
• ISBN 13: 9781441923066
• Reliure: Broché
• Nombre de pages: 296
• Coordonnées du fabricant: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Allemagne