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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - Couverture souple

 
9781441935748: Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
Couverture souple
ISBN 10 : 1441935746 ISBN 13 : 9781441935748
Editeur : Springer, 2010

Synopsis

Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instruments

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Éditeur
Springer
Date d'édition
2010
Langue
anglais
ISBN 10 
1441935746
ISBN 13 
9781441935748
Reliure
Broché
Nombre de pages
376
Éditeur
Giannuzzi Lucille A., North Carolina State University
Coordonnées du fabricant
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