Articles liés à Data Mining and Diagnosing IC Fails
Synopsis
There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques from other data analysis environments are appropriate for analyzing IC fails, but have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. The description techniques and analysis routines are sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.
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- ÉditeurSpringer
- Date d'édition2010
- ISBN 10 1441937676
- ISBN 13 9781441937674
- ReliureBroché
- Langueanglais
- Nombre de pages272
- Coordonnées du fabricantnon disponible
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Makes various data mining and diagnostic techniques available in one place to professionalsThe techniques described in this book are not available in one place, and many are not even available in any bookPresents a new diagnosis technique S. N° de réf. du vendeur 458485048
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Data Mining and Diagnosing IC Fails
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ISBN 10 : 1441937676
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done. 250 pp. Englisch. N° de réf. du vendeur 9781441937674
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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done. N° de réf. du vendeur 9781441937674
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
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