Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Couverture souple

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9781441945136: Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
Couverture souple
ISBN 10 : 144194513X ISBN 13 : 9781441945136
Editeur : Springer, 2010

Synopsis

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer
Date d'édition
2010
Langue
anglais
ISBN 10 
144194513X
ISBN 13 
9781441945136
Reliure
Broché
Nombre de pages
420
Éditeur
Tehranipoor Mohammad
Coordonnées du fabricant
ProductSafety@springernature.com
ProductSafety@springernature.com

Poststr. 9
Darmstadt
64293
Allemagne

Autres éditions populaires du même titre

9780387747460: Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

Edition présentée

ISBN 10 :  038774746X ISBN 13 :  9780387747460
Editeur : Springer-Verlag New York Inc., 2007
Couverture rigide