Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy - Couverture rigide

Couverture rigide

ISBN 10 : 144196567X ISBN 13 : 9781441965677

Editeur : Springer-Verlag New York Inc., 2010

Synopsis

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

A propos du livre

À propos de l'auteur

Sergei Kalinin is a researcher at Oak Ridge National Laboratory. Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.

Détails de l'édition

• Éditeur: Springer-Verlag New York Inc.
• Date d'édition: 2010
• Langue: anglais
• ISBN 10: 144196567X
• ISBN 13: 9781441965677
• Reliure: Relié
• Nombre de pages: 573
• Éditeur: Kalinin Sergei V., Gruverman Alexei
• Coordonnées du fabricant: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Allemagne