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9781461426172: Coupled Data Communication Techniques for High-Performance and Low-Power Computing

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Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)

Ho, Ron [Editor]; Drost, Robert [Editor];

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ISBN 10 : 1441965874 ISBN 13 : 9781441965875

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Hardcover. Etat : Very Good. First Edition. The binding is tight, corners sharp. Text and images are unmarked. 8vo. xvi, 206pp. N� de r�f. du vendeur CHAPhoCD

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Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)

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Coupled Data Communication Techniques for High-Performance and Low-Power Computing

Ron Ho

Edit� par SPRINGER NATURE Jun 2010, 2010

ISBN 10 : 1441965874 ISBN 13 : 9781441965875

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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible. 206 pp. Englisch. N� de r�f. du vendeur 9781441965875

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Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)

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Coupled Data Communication Techniques for High-Performance and Low-Power Computing

Ho, Ron|Drost, Robert

Edit� par Springer US, 2010

ISBN 10 : 1441965874 ISBN 13 : 9781441965875

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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Serves as a collection of the best-known-methods and ideas from leaders in the field.Includes a carefully-selected set of discussions on the important issues, tradeoffs, and techniques in coupled data I/O.Provides an overview of the circuit. N� de r�f. du vendeur 4176107

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Coupled Data Communication Techniques for High-Performance and Low-Power Computing

Ron Ho

Edit� par Springer Us, 2010

ISBN 10 : 1441965874 ISBN 13 : 9781441965875

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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible. N� de r�f. du vendeur 9781441965875