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Description du livre Hardcover. Etat : new. N° de réf. du vendeur 9781441979575
Description du livre Etat : New. N° de réf. du vendeur ABLIING23Mar2411530297487
Description du livre Etat : New. N° de réf. du vendeur 12024556-n
Description du livre Etat : New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. N° de réf. du vendeur ria9781441979575_lsuk
Description du livre Etat : New. N° de réf. du vendeur 12024556-n
Description du livre Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. 218 pp. Englisch. N° de réf. du vendeur 9781441979575
Description du livre Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents the first comprehensive reference to reliability and repair techniques for nano-scale memoriesCovers both the mathematical foundations and engineering applications of yield and reliability in nano-scale memoriesIncludes a variety o. N° de réf. du vendeur 4176479
Description du livre Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. N° de réf. du vendeur 9781441979575
Description du livre Etat : New. Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations. Series: Integrated Circuits and Systems. Num Pages: 218 pages, biography. BIC Classification: TBD; TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 159 x 20. Weight in Grams: 478. . 2011. Hardback. . . . . N° de réf. du vendeur V9781441979575
Description du livre Etat : New. Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations. Series: Integrated Circuits and Systems. Num Pages: 218 pages, biography. BIC Classification: TBD; TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 159 x 20. Weight in Grams: 478. . 2011. Hardback. . . . . Books ship from the US and Ireland. N° de réf. du vendeur V9781441979575