Coupled Data Communication Techniques for High-Performance and Low-Power Computing - Couverture souple

9781461426172: Coupled Data Communication Techniques for High-Performance and Low-Power Computing

Couverture souple

ISBN 10 : 1461426170 ISBN 13 : 9781461426172

Editeur : Springer, 2012

Afficher les exemplaires de cette �dition comportant l?ISBN

1 D'occasion

De EUR 225,87

10 Neuf

De EUR 136,16

Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ?ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a ?rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a ?aw. If such ?aws were the result only of dust one might reduce their numbers, but ?aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de?ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.

Les informations fournies dans la section � Synopsis � peuvent faire r�f�rence � une autre �dition de ce titre.

Pr�sentation de l'�diteur

This overview of the circuits, architectures, and chip packaging for coupled data techniques discusses current research in chip-to-board capacitive coupling, chip-to-chip capacitive coupling, chip-to-chip inductive coupling, and chip-to-chip optical coupling.

Les informations fournies dans la section � A propos du livre � peuvent faire r�f�rence � une autre �dition de ce titre.

�diteur: Springer
Date d'�dition: 2012
Langue: anglais
ISBN 10: 1461426170
ISBN 13: 9781461426172
Reliure: Broch�
Nombre de pages: 224
�diteur: Ho Ron, Drost Robert
Coordonn�es du fabricant: non disponible
Personne responsable: CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Allemagne

Acheter D'occasion

�tat : Comme neuf

Like New

Afficher cet article

EUR 225,87

Autre devise

EUR 28,85 exp�dition depuis Royaume-Uni vers France

Destinations, frais et d�lais

Ajouter au panier

Acheter neuf

Afficher cet article

EUR 136,16

Autre devise

EUR 9,70 exp�dition depuis Allemagne vers France

Destinations, frais et d�lais

Ajouter au panier

Autres �ditions populaires du m�me titre

9781441965875: Coupled Data Communication Techniques for High-Performance and Low-Power Computing

Edition pr�sent�e

ISBN 10 : 1441965874 ISBN 13 : 9781441965875
Editeur : Springer-Verlag New York Inc., 2010
Couverture rigide

Springer, 2011 (Couverture souple)

R�sultats de recherche pour Coupled Data Communication Techniques for High-Performance...

Image fournie par le vendeur

Coupled Data Communication Techniques for High-Performance and Low-Power Computing

Ho, Ron|Drost, Robert

Edit� par Springer US, 2012

ISBN 10 : 1461426170 ISBN 13 : 9781461426172

Neuf Couverture souple

impression � la demande

Vendeur : moluna, Greven, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Serves as a collection of the best-known-methods and ideas from leaders in the field.Includes a carefully-selected set of discussions on the important issues, tradeoffs, and techniques in coupled data I/O.Provides an overview of the circuit. N� de r�f. du vendeur 4197612

Contacter le vendeur

Acheter neuf

EUR 136,16

Autre devise

Frais de port : EUR 9,70

De Allemagne vers France

Destinations, frais et d�lais

Quantit� disponible : Plus de 20 disponibles

Ajouter au panier

Image d'archives

Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)

Edit� par Springer, 2012

ISBN 10 : 1461426170 ISBN 13 : 9781461426172

Neuf Couverture souple

Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni

�valuation du vendeur 5 sur 5 �toiles

Etat : New. In. N� de r�f. du vendeur ria9781461426172_new

Contacter le vendeur

Acheter neuf

EUR 165,51

Autre devise

Frais de port : EUR 4,61

De Royaume-Uni vers France

Destinations, frais et d�lais

Quantit� disponible : Plus de 20 disponibles

Ajouter au panier

Image fournie par le vendeur

Coupled Data Communication Techniques for High-Performance and Low-Power Computing

Robert Drost

Edit� par Springer US Sep 2012, 2012

ISBN 10 : 1461426170 ISBN 13 : 9781461426172

Neuf Taschenbuch

impression � la demande

Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible. 224 pp. Englisch. N� de r�f. du vendeur 9781461426172

Contacter le vendeur

Acheter neuf

EUR 160,49

Autre devise

Frais de port : EUR 11

De Allemagne vers France

Destinations, frais et d�lais

Quantit� disponible : 2 disponible(s)

Ajouter au panier

Image fournie par le vendeur

Coupled Data Communication Techniques for High-Performance and Low-Power Computing

Robert Drost

Edit� par Springer US, Springer US, 2012

ISBN 10 : 1461426170 ISBN 13 : 9781461426172

Neuf Taschenbuch

Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible. N� de r�f. du vendeur 9781461426172

Contacter le vendeur

Acheter neuf

EUR 162,91

Autre devise

Frais de port : EUR 10,99

De Allemagne vers France

Destinations, frais et d�lais

Quantit� disponible : 1 disponible(s)

Ajouter au panier

Image fournie par le vendeur

Coupled Data Communication Techniques for High-Performance and Low-Power Computing

Robert Drost

Edit� par Springer US, Springer US Sep 2012, 2012

ISBN 10 : 1461426170 ISBN 13 : 9781461426172

Neuf Taschenbuch

Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Taschenbuch. Etat : Neu. Neuware -Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 224 pp. Englisch. N� de r�f. du vendeur 9781461426172

Contacter le vendeur