Statistical Analysis of Panel Count Data - Couverture rigide

Sun, Jianguo; Zhao, Xingqiu

Couverture rigide

ISBN 10 : 1461487145 ISBN 13 : 9781461487142

Editeur : Springer-Verlag New York Inc., 2013

Synopsis

The first comprehensive examination of an emerging topic, this text complements existing resources on recurrent event data, and includes detailed treatment of regression, parametric and non-parametric methodologies, and mathematical calculations.

A propos du livre

À propos de l?auteur

Jianguo (Tony) Sun is a professor at the Department of Statistics of the University of Missouri. He obtained his Ph.D. at the University of Waterloo and has been developing novel statistical methods for the analysis of interval-censored failure time data and panel count data over the last 20 years. In particular, he published "The Statistical Analysis of Interval-censored Failure Time Data" (Springer, 2006), the first book on interval-censored data. He also co-authored with Drs. Chen and Peace the volume "Interval-censored Time-to-Event Data: Methods and Applications" (Chapman and Hall, 2012).

Xingqiu Zhao is a faculty member of The Hong Kong Polytechnic University and she obtained her Ph.D. at McMaster University. Her research interests include econometrics, financial mathematics, longitudinal data analysis, stochastic process models and applications, survival analysis, and time series analysis. In particular, she has published many papers on new statistical inference procedures for analyzing interval-censored failure time data, recurrent event data and panel count data.

Détails de l'édition

• Éditeur: Springer-Verlag New York Inc.
• Date d'édition: 2013
• Langue: anglais
• ISBN 10: 1461487145
• ISBN 13: 9781461487142
• Reliure: Relié
• Nombre de pages: 286
• Coordonnées du fabricant: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Uhlandstraße 14; Stuttgart; 70182; Allemagne