Elastic and Inelastic Scattering in Electron Diffraction and Imaging - Couverture souple

Zhong-lin Wang, Zhong-Lin

Couverture souple

ISBN 10 : 1489915818 ISBN 13 : 9781489915818

Editeur : Springer, 2013

Synopsis

Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros- copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten- sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.

A propos du livre

Présentation de l'éditeur

This unique volume provides comprehensive coverage of the theories and techniques of elastic and inelastic electron diffraction and imaging as well as their applications in quantitative structure determination using transmission and scanning transmission electron microscopy. The author summarizes principles, techniques, and applications in his discussions of thermal diffusely scattered, valence-loss, and atomic inner-shell scattered electrons in compositional sensitive imaging.

Détails de l'édition

• Éditeur: Springer
• Date d'édition: 2013
• Langue: anglais
• ISBN 10: 1489915818
• ISBN 13: 9781489915818
• Reliure: Broché
• Nombre de pages: 480
• Coordonnées du fabricant: non disponible
• Personne responsable: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Allemagne