Particles in Gases and Liquids 2: Detection, Characterization, and Control - Couverture souple

9781489935465: Particles in Gases and Liquids 2: Detection, Characterization, and Control

Couverture souple

ISBN 10 : 1489935460 ISBN 13 : 9781489935465

Editeur : Springer, 2013

Afficher les exemplaires de cette �dition comportant l'ISBN

This book chronicles the proceedings of the Second Symposium on Particles in Gases and Liquids: Detection, Characterization and Control held as a part of the 20th Annual Fine Particle Society meeting in Boston, August 21-25, 1989. As this second symposium was as successful as the prior one, so we have decided to hold symposia on this topic on a regular (biennial) basis and the third symposium in this series is scheduled to be held at the 22nd Annual Meeting of the Fine Particle Society in San Jose, California, July 29-August 2, 1991. l As pointed out in the Preface to the prior volume in this series that recently there has been tremendous concern about yield losses due to unwanted particles, and these unwelcome particles can originate from a legion of sources, including process gases and liquids. Also all signals indicate that in the future manufacture of sophisticated and sensitive microelectronic components (with shrinking dimensions) and other precision parts, the need for detection, characterization, analysis and control of smaller and smaller particles will be more intensified.

Les informations fournies dans la section � Synopsis � peuvent faire r�f�rence � une autre �dition de ce titre.

�diteur: Springer
Date d'�dition: 2013
Langue: anglais
ISBN 10: 1489935460
ISBN 13: 9781489935465
Reliure: Broch�
Nombre de pages: 420
�diteur: Mittal K.L.
Coordonn�es du fabricant: non disponible
Personne responsable: CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Allemagne

R�sultats de recherche pour Particles in Gases and Liquids 2: Detection, Characterizatio...

Image d'archives

Particles in Gases and Liquids 2: Detection, Characterization, and Control

Edit� par Springer, 2013

ISBN 10 : 1489935460 ISBN 13 : 9781489935465

Neuf Couverture souple

Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni

�valuation du vendeur 5 sur 5 �toiles

Etat : New. In. N� de r�f. du vendeur ria9781489935465_new

Contacter le vendeur

Acheter neuf

EUR 165,36

Exp�dition �EUR 13,15
Exp�dition depuis Royaume-Uni vers Etats-Unis

Quantit� disponible : Plus de 20 disponibles

Ajouter au panier

Image fournie par le vendeur

Particles in Gases and Liquids 2

K. L. Mittal

Edit� par Springer US Aug 2013, 2013

ISBN 10 : 1489935460 ISBN 13 : 9781489935465

Neuf Taschenbuch

impression � la demande

Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book chronicles the proceedings of the Second Symposium on Particles in Gases and Liquids: Detection, Characterization and Control held as a part of the 20th Annual Fine Particle Society meeting in Boston, August 21-25, 1989. As this second symposium was as successful as the prior one, so we have decided to hold symposia on this topic on a regular (biennial) basis and the third symposium in this series is scheduled to be held at the 22nd Annual Meeting of the Fine Particle Society in San Jose, California, July 29-August 2, 1991. l As pointed out in the Preface to the prior volume in this series that recently there has been tremendous concern about yield losses due to unwanted particles, and these unwelcome particles can originate from a legion of sources, including process gases and liquids. Also all signals indicate that in the future manufacture of sophisticated and sensitive microelectronic components (with shrinking dimensions) and other precision parts, the need for detection, characterization, analysis and control of smaller and smaller particles will be more intensified. 420 pp. Englisch. N� de r�f. du vendeur 9781489935465

Contacter le vendeur

Acheter neuf

EUR 160,49

Exp�dition �EUR 23
Exp�dition depuis Allemagne vers Etats-Unis

Quantit� disponible : 2 disponible(s)

Ajouter au panier

Image fournie par le vendeur

Particles in Gases and Liquids 2

Mittal, K. L.

Edit� par Springer US, 2013

ISBN 10 : 1489935460 ISBN 13 : 9781489935465

Neuf Couverture souple

impression � la demande

Vendeur : moluna, Greven, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the Second Symposium on Particles in Gases and Liquids, held at the 20th Annual Meeting of the Fine Particle Society, in Boston, Massachusetts, August 21-25, 1989 This book chronicles the proceedings of the Second Symposium on Particles. N� de r�f. du vendeur 4212110

Contacter le vendeur

Acheter neuf

EUR 136,16

Exp�dition �EUR 48,99
Exp�dition depuis Allemagne vers Etats-Unis

Quantit� disponible : Plus de 20 disponibles

Ajouter au panier

Image fournie par le vendeur

Particles in Gases and Liquids 2 : Detection, Characterization, and Control

K. L. Mittal

Edit� par Springer, 2013

ISBN 10 : 1489935460 ISBN 13 : 9781489935465

Neuf Taschenbuch

Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book chronicles the proceedings of the Second Symposium on Particles in Gases and Liquids: Detection, Characterization and Control held as a part of the 20th Annual Fine Particle Society meeting in Boston, August 21-25, 1989. As this second symposium was as successful as the prior one, so we have decided to hold symposia on this topic on a regular (biennial) basis and the third symposium in this series is scheduled to be held at the 22nd Annual Meeting of the Fine Particle Society in San Jose, California, July 29-August 2, 1991. l As pointed out in the Preface to the prior volume in this series that recently there has been tremendous concern about yield losses due to unwanted particles, and these unwelcome particles can originate from a legion of sources, including process gases and liquids. Also all signals indicate that in the future manufacture of sophisticated and sensitive microelectronic components (with shrinking dimensions) and other precision parts, the need for detection, characterization, analysis and control of smaller and smaller particles will be more intensified. N� de r�f. du vendeur 9781489935465

Contacter le vendeur

Acheter neuf

EUR 174,36

Exp�dition �EUR 30,50
Exp�dition depuis Allemagne vers Etats-Unis

Quantit� disponible : 1 disponible(s)

Ajouter au panier

Image fournie par le vendeur

Particles in Gases and Liquids 2

K. L. Mittal

Edit� par Springer US, Springer US Aug 2013, 2013

ISBN 10 : 1489935460 ISBN 13 : 9781489935465

Neuf Taschenbuch

impression � la demande

Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book chronicles the proceedings of the Second Symposium on Particles in Gases and Liquids: Detection, Characterization and Control held as a part of the 20th Annual Fine Particle Society meeting in Boston, August 21-25, 1989. As this second symposium was as successful as the prior one, so we have decided to hold symposia on this topic on a regular (biennial) basis and the third symposium in this series is scheduled to be held at the 22nd Annual Meeting of the Fine Particle Society in San Jose, California, July 29-August 2, 1991. l As pointed out in the Preface to the prior volume in this series that recently there has been tremendous concern about yield losses due to unwanted particles, and these unwelcome particles can originate from a legion of sources, including process gases and liquids. Also all signals indicate that in the future manufacture of sophisticated and sensitive microelectronic components (with shrinking dimensions) and other precision parts, the need for detection, characterization, analysis and control of smaller and smaller particles will be more intensified.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 420 pp. Englisch. N� de r�f. du vendeur 9781489935465

Contacter le vendeur