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Synopsis
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
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Power-Aware Testing and Test Strategies for Low Power Devices
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Is the only comprehensive book on power-aware test for (low power) circuits and systemsInstructs readers how low-power devices can be tested safely without affecting yield and reliabilityIncludes necessary background information on design f. N° de réf. du vendeur 4212787
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Power-Aware Testing and Test Strategies for Low Power Devices
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. 388 pp. Englisch. N° de réf. du vendeur 9781489983138
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Power-Aware Testing and Test Strategies for Low Power Devices
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Springer US, Springer New York Sep 2014, 2014
ISBN 10 : 1489983139
ISBN 13 : 9781489983138
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 388 pp. Englisch. N° de réf. du vendeur 9781489983138
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Power-Aware Testing and Test Strategies for Low Power Devices
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Power-Aware Testing and Test Strategies for Low Power Devices
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Springer US, Springer New York, 2014
ISBN 10 : 1489983139
ISBN 13 : 9781489983138
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Taschenbuch
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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. N° de réf. du vendeur 9781489983138
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Power-Aware Testing and Test Strategies (eng)
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Power-Aware Testing and Test Strategies for Low Power Devices
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Springer-Verlag New York Inc., 2014
ISBN 10 : 1489983139
ISBN 13 : 9781489983138
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Power-Aware Testing and Test Strategies for Low Power.
Vendeur : Books Puddle, New York, NY, Etats-Unis
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Etat : New. pp. 388. N° de réf. du vendeur 26356736238
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Power-Aware Testing and Test Strategies for Low Power Devices
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Power-Aware Testing and Test Strategies for Low Power.
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