Analog IC Reliability in Nanometer CMOS - Couverture souple

Maricau, Elie; Gielen, Georges

Couverture souple

ISBN 10 : 1489986308 ISBN 13 : 9781489986306

Editeur : Springer, 2015

Synopsis

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

A propos du livre

Présentation de l'éditeur

This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.

Détails de l'édition

• Éditeur: Springer
• Date d'édition: 2015
• Langue: anglais
• ISBN 10: 1489986308
• ISBN 13: 9781489986306
• Reliure: Broché
• Nombre de pages: 216
• Coordonnées du fabricant: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Allemagne