Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield - Couverture souple

Abu Rahma, Mohamed; Anis, Mohab

 
9781493902200: Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
Couverture souple
ISBN 10 : 1493902202 ISBN 13 : 9781493902200
Editeur : Springer, 2014

Synopsis

Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power.

This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies.

  • Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques;
  • Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view;
  • Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Springer
Date d'édition
2014
Langue
anglais
ISBN 10 
1493902202
ISBN 13 
9781493902200
Reliure
Broché
Nombre de pages
188
Coordonnées du fabricant
ProductSafety@springernature.com
ProductSafety@springernature.com

Poststr. 9
Darmstadt
64293
Allemagne

Autres éditions populaires du même titre

9781461417484: Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield

Edition présentée

ISBN 10 :  1461417481 ISBN 13 :  9781461417484
Editeur : Springer-Verlag New York Inc., 2012
Couverture rigide