Ellipsometry in the Measurement of Surfaces and Thin Films (Classic Reprint) - Couverture souple

Passaglia, E.

9781527767133: Ellipsometry in the Measurement of Surfaces and Thin Films (Classic Reprint)

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ISBN 10 : 1527767132 ISBN 13 : 9781527767133

Editeur : Forgotten Books, 2018

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A concise, field-defining collection on ellipsometry for surfaces and thin films. This volume gathers 20 technical papers from a 1963 symposium, offering both historical context and cutting-edge methods in a single, self-contained reference.

- Learn how ellipsometry measures film thickness and optical constants, and how exact Drude-based equations are applied with modern computing.
- Explore techniques for oxide films, metal surfaces, and adsorption phenomena, including in situ and aqueous environments.
- Review instrumentation advances, computation approaches, and practical applications in metallurgy, corrosion, and solid-state electronics.
- See theoretical developments, experimental sensitivity considerations, and diverse data interpretations through real-world examples.

Ideal for researchers and technicians beginning or advancing work in surface science, thin films, and optical characterization. This edition is a solid foundation for understanding the state of the art and its applications in industry and academia.

Les informations fournies dans la section � Synopsis � peuvent faire r�f�rence � une autre �dition de ce titre.

�diteur: Forgotten Books
Date d'�dition: 2018
Langue: anglais
ISBN 10: 1527767132
ISBN 13: 9781527767133
Reliure: Broch�
Nombre de pages: 371
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Ellipsometry in the Measurement of Surfaces and Thin Films (Classic Reprint)

E. Passaglia, R. R. Stromberg

Edit� par Forgotten Books, 2018

ISBN 10 : 1527767132 ISBN 13 : 9781527767133

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Vendeur : Forgotten Books, London, Royaume-Uni

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Paperback. Etat : New. Print on Demand. This book is a collection of papers presented at a symposium on ellipsometry, a technique that uses the change in polarization of light upon reflection to study the optical properties of surfaces and thin films. The book begins with a historical review of ellipsometry, from its early development to its present-day applications. The following papers discuss the theory of ellipsometry, computational techniques, instrumentation, and applications in various fields such as the study of metal surfaces, oxide films, and organic films. The book provides a comprehensive overview of ellipsometry and its applications, making it a valuable resource for researchers and practitioners in the field of optics and surface science. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. N� de r�f. du vendeur 9781527767133_0

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