Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, April 1 to June 30, 1973 (Classic Reprint) - Couverture souple
Autres éditions populaires du même titre
Résultats de recherche pour Methods of Measurement for Semiconductor Materials,...
Image fournie par le vendeur
Methods of Measurement for Semiconductor Materials, Process Control, and
impression à la demandeVendeur : Forgotten Books, London, Royaume-Uni
Évaluation du vendeur 4 sur 5 étoiles
Paperback. Etat : New. Print on Demand. This book details the work done by the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices. Launched in 1968 through the combined efforts of the National Bureau of Standards, the Defense Nuclear Agency, the Defense Advanced Research Projects Agency, the U.S. Navy Strategic Systems Project Office, the Air Force Weapons Laboratory and the Atomic Energy Commission, the program's purpose was to elevate the performance and reliability of discrete semiconductor devices and integrated circuits through improved measurement methods. Split into five focused sections, this book is the product of years of research, including: resistivity, generation-recombination-trapping centers, carrier mobility, die attachment evaluation, and thermal properties of devices. It explores novel testing methods, presents new measurement techniques, and lays the groundwork for improved quality control and manufacturing processes. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. N° de réf. du vendeur 9781528125512_0
Acheter neuf
EUR 16,12
Livraison gratuite
Expédition depuis Royaume-Uni vers Etats-Unis
Expédition depuis Royaume-Uni vers Etats-Unis
Quantité disponible : Plus de 20 disponibles
Image d'archives
Methods of Measurement for Semiconductor Materials, Process Control, and Devices
Vendeur : PBShop.store US, Wood Dale, IL, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
PAP. Etat : New. New Book. Shipped from UK. Established seller since 2000. N° de réf. du vendeur LX-9781528125512
Acheter neuf
EUR 22,99
Livraison gratuite
Expédition nationale : Etats-Unis
Expédition nationale : Etats-Unis
Quantité disponible : 15 disponible(s)
Image d'archives
Methods of Measurement for Semiconductor Materials, Process Control, and Devices
Vendeur : PBShop.store UK, Fairford, GLOS, Royaume-Uni
Évaluation du vendeur 5 sur 5 étoiles
PAP. Etat : New. New Book. Shipped from UK. Established seller since 2000. N° de réf. du vendeur LX-9781528125512
Acheter neuf
EUR 24,87
Expédition à EUR 3,81
Expédition depuis Royaume-Uni vers Etats-Unis
Expédition depuis Royaume-Uni vers Etats-Unis
Quantité disponible : 15 disponible(s)