Reliability and Materials Issues of Semiconductor Optical and Electrical Devices and Materials: Volume 1195 - Couverture rigide

Couverture rigide

ISBN 10 : 1605111686 ISBN 13 : 9781605111681

Editeur : Cambridge University Press, 2010

Synopsis

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

A propos du livre

Présentation de l'éditeur

Achieving high reliability is a key issue for semiconductor optical and electrical devices and is as important as device performance for commercial application. Degradation of both optical and electrical devices is strongly related to materials issues. A variety of material defects can occur during the device fabrication processes, i.e., crystal growth, impurity diffusion, ion-implantation, wet/dry etching, metallization, bonding, packaging, etc. This book focuses on the current status of reliability and degradation of various semiconductor optical and electrical devices as well as their materials issues in thin-film growth, wafer processing, and device fabrication processes. Topics include: laser reliability; degradation mechanisms; optical devices and reliability; electronic device reliability; wide-bandgap devices; compound semiconductors; characterization; characterization methods; strain effects; defects and growth; diffusion barriers; organic and other materials and novel structures.

Détails de l'édition

• Éditeur: Cambridge University Press
• Date d'édition: 2010
• Langue: anglais
• ISBN 10: 1605111686
• ISBN 13: 9781605111681
• Reliure: Relié
• Nombre de pages: 376
• Éditeur: Ueda Osamu, Fukuda Mitsuo, Pearton Stephen J., Piner Edwin L., Montangero Paolo
• Coordonnées du fabricant: non disponible
• Personne responsable: Avery; https://www.avery.fr/; ; chemin des peupliers 27; Dardilly; France