State-Of-The-Art Developments in Materials Characterization: Volume 1754 - Couverture rigide

 
9781605117317: State-Of-The-Art Developments in Materials Characterization: Volume 1754
Couverture rigide
ISBN 10 : 1605117315 ISBN 13 : 9781605117317
Editeur : Materials Research Society, 2016

Synopsis

Symposium OO, 'In Situ Characterization of Dynamic Processes during Materials Synthesis and Transformation'; Symposium PP, 'Advances in Scanning Probe Microscopy for Multimodal Imaging at the Nanoscale'; Symposium QQ, 'Advances in Nanoscale Subsurface, Chemical and Time-Resolved Studies of Soft Matter'; and Symposium TT, 'Advanced Materials Exploration with Neutrons and X-Rays - The State-of-the-Art in the International Year of Crystallography', were held from 30th November-5th December at the 2014 MRS Fall Meeting in Boston, Massachusetts. The papers have been organized to convey advances in the in situ characterization of dynamic processes, scanning probe microscopy for multimodal imaging at the nanoscale, and X-rays for material science. Manuscripts in this volume explore various aspects of the most recent developments in metrology and characterization of materials at the most fundamental level, with spatial resolution down to the nanometer range.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Materials Research Society
Date d'édition
2016
Langue
anglais
ISBN 10 
1605117315
ISBN 13 
9781605117317
Reliure
Relié
Nombre de pages
170
Éditeur
Barabash Rozaliya, Benning Liane G, Genc Arda, Kim Yunseok, Lereu Aude, Li Dongsheng, Lienert Ulrich, Liss Klaus-Dieter, Ohnuma Masato, Ovchinnikova Olga, Passian Ali, Rimer Jeffrey D, Tetard Laurene, Thundat Thomas, Zenobi Renato, Zorba Vassilia
Coordonnées du fabricant
Cambridge University Press
https://www.cambridge.org/

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