Electromagnetic Field Standards and Exposure Systems - Couverture rigide

Grudzinski, Eugeniusz; Trzaska, Hubert

Couverture rigide

ISBN 10 : 161353177X ISBN 13 : 9781613531778

Editeur : SciTech Publishing Inc, 2013

Synopsis

Electromagnetic Field Standards and Exposure Systems covers the broader fields of measurements in telecommunications, radio navigation, radio astronomy, bioscience, and free ranging EM radiation and helps to develop the following measurement standards;

• proper calibration of the measuring instrument
• external environmental factors that affect accuracy
• competence and training of the instrument operator

A propos du livre

À propos des auteurs

Dr Eugeniusz Grudzinski, born in 1948 in Wroclaw, Poland. He completed his MSc EE, DSc and Ph.Dr. degrees at the Technical University of Wroclaw in 1973, 1981 and 1998, respectively. He is currently Head of the EMF Standards and Measurements Lab and Lecturer at the University. Dr. Grudzinski is the author of many publications in the field of EMF metrology. His book on EMF standards and measurements was originally published in Polish to immediate success.

Prof. Hubert Trzaska born in 1939 in Wilno, Poland (presently Vilnius, Lithuania). He is Head of the EM Environment Protection Lab at the University of Wroclaw, devoting his research to the practical aspects of EMF metrology. He holds over 70 patents in the field of EMF measurements and standards. He is the author of Electromagnetic Measurements in the Near Field, Second Edition (SciTech-IET).

Détails de l'édition

• Éditeur: SciTech Publishing Inc
• Date d'édition: 2013
• Langue: anglais
• ISBN 10: 161353177X
• ISBN 13: 9781613531778
• Reliure: Relié
• Nombre de pages: 216
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible