Articles liés à Electromagnetic Field Standards and Exposure Systems

Electromagnetic Field Standards and Exposure Systems - Couverture rigide

Grudzinski, Eugeniusz; Trzaska, Hubert

 
9781613531778: Electromagnetic Field Standards and Exposure Systems
Couverture rigide
ISBN 10 : 161353177X ISBN 13 : 9781613531778
Editeur : SciTech Publishing Inc, 2013

Synopsis

This book addresses the need to establish measurement standards for electromagnetic fields to produce accurate results and is ideal for engineers concerned with measurement techniques.

While it provides a review of fundamental properties of electromagnetic fields and the simple antennas that can generate and receive such fields, the main focus of this book is dedicated to the analysis of the accuracy of measurements and field standards using a range of radiating structures. It is designed to help develop the following measurement standards: proper calibration of the measuring instrument, external environmental factors that affect accuracy and competence and training of the instrument operator. As such, it is ideal for practicing engineers in the field of antennas, electromagnetic compatibility and electromagnetic propagation who are concerned with measurement techniques.

This is a companion book to Electromagnetic Measurements of the Near Field.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

À propos des auteurs

Dr Eugeniusz Grudzinski, born in 1948 in Wroclaw, Poland. He completed his MSc EE, DSc and Ph.Dr. degrees at the Technical University of Wroclaw in 1973, 1981 and 1998, respectively. He is currently Head of the EMF Standards and Measurements Lab and Lecturer at the University. Dr. Grudzinski is the author of many publications in the field of EMF metrology. His book on EMF standards and measurements was originally published in Polish to immediate success.



Prof. Hubert Trzaska born in 1939 in Wilno, Poland (presently Vilnius, Lithuania). He is Head of the EM Environment Protection Lab at the University of Wroclaw, devoting his research to the practical aspects of EMF metrology. He holds over 70 patents in the field of EMF measurements and standards. He is the author of Electromagnetic Measurements in the Near Field, Second Edition (SciTech-IET).

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
SciTech Publishing Inc
Date d'édition
2013
Langue
anglais
ISBN 10 
161353177X
ISBN 13 
9781613531778
Reliure
Relié
Nombre de pages
201
Coordonnées du fabricant
non disponible
Personne responsable
non disponible