Backscattering from Multiscale Rough Surfaces With Application to Wind Scatterometry - Couverture rigide

Fung, Adrian

Couverture rigide

ISBN 10 : 1630810002 ISBN 13 : 9781630810009

Editeur : Artech House Publishers, 2015

Synopsis

This resource explains and demonstrates the backscattering properties of multiscale rough surfaces, and illustrates their application to establish the geophysical model function (GMF) needed in wind scatterometry. This book also explains how the mechanisms of backscattering change with frequency and the incident angle on a multiscale surface and how to recognize single scale versus multiscale surfaces. Very useful information for those wanting to use backscattering models more efficiently.

A propos du livre

À propos de l?auteur

Adrian K. Fung was previously the director of the Wave Scattering Research Center and Jenkins Garrett professor of electrical engineering, and a member of the Academy of Distinguished Scholars at the University of Texas at Arlington. Dr. Fung is also a life fellow of the Institute of Electrical and Electronic Engineers and a member of U.S. Commission F of the International Scientific Radio Union. He earned his Ph.D. from the University of Kansas, Lawrence.

Détails de l'édition

• Éditeur: Artech House Publishers
• Date d'édition: 2015
• Langue: anglais
• ISBN 10: 1630810002
• ISBN 13: 9781630810009
• Reliure: Relié
• Nombre de pages: 328
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible