Articles liés à Encyclopedia of Scanning Electron Microscopy

Encyclopedia of Scanning Electron Microscopy - Couverture rigide

 
9781632381668: Encyclopedia of Scanning Electron Microscopy
Couverture rigide
ISBN 10 : 1632381664 ISBN 13 : 9781632381668
Editeur : NY Research Press, 2015

Synopsis

This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. This book includes contributions by renowned researchers and experts in this field.

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Éditeur
NY Research Press
Date d'édition
2015
Langue
anglais
ISBN 10 
1632381664
ISBN 13 
9781632381668
Reliure
Relié
Nombre de pages
324
Éditeur
Page Lisa
Coordonnées du fabricant
non disponible
Personne responsable
gpsr@libri.de
gpsr@libri.de

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