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Synopsis
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.
Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on "complete" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
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À propos de l?auteur
Paul Hockett earned his PhD in 2008 from the University of Nottingham, UK and joined the National Research Council of Canada in 2009. Paul's research interests cover a range of topics spanning the areas of AMO (atomic, molecular, and optical), quantum, and computational physics (and physical chemistry), with a particular focus on fundamental light-matter interactions, spectroscopy, and application to complex systems.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
- ÉditeurMorgan & Claypool Publishers
- Date d'édition2018
- ISBN 10 1643270001
- ISBN 13 9781643270005
- ReliureRelié
- Langueanglais
- Nombre de pages125
- Coordonnées du fabricantnon disponible
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Quantum Metrology with Photoelectrons: Volume II: Applications and Advances
Edité par
IOP Concise Physics, 2018
ISBN 10 : 1643270001
ISBN 13 : 9781643270005
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Gebunden. Etat : New. KlappentextrnrnSince the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and. N° de réf. du vendeur 477464591
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Quantum Metrology with Photoelectrons: Volume II: Applications and Advances (Iop Concise Physics)
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Iop Concise Physics, 2018
ISBN 10 : 1643270001
ISBN 13 : 9781643270005
Neuf
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Quantum Metrology with Photoelectrons, Volume II Applications and Advances Iop Concise Physics
Edité par
Morgan and Claypool Publishers, 2018
ISBN 10 : 1643270001
ISBN 13 : 9781643270005
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Quantum Metrology with Photoelectrons, Volume II Applications and Advances Iop Concise Physics
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Morgan and Claypool Publishers, 2018
ISBN 10 : 1643270001
ISBN 13 : 9781643270005
Neuf
Couverture rigide
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Quantum Metrology with Photoelectrons, Volume II: Applications and Advances (Iop Concise Physics)
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Iop Concise Physics, 2018
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ISBN 13 : 9781643270005
Neuf
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Quantum Metrology with Photoelectrons, Volume II: Applications and Advances
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ISBN 13 : 9781643270005
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Quantum Metrology with Photoelectrons, Volume II: Applications and Advances (Iop Concise Physics)
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ISBN 13 : 9781643270005
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Quantum Metrology with Photoelectrons, Volume II: Applications and Advances (Iop Concise Physics)
Edité par
Iop Concise Physics, 2018
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ISBN 13 : 9781643270005
Neuf
Couverture rigide
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Quantum Metrology with Photoelectrons : Volume II: Applications and Advances
Edité par
IOP Concise Physics, 2018
ISBN 10 : 1643270001
ISBN 13 : 9781643270005
Neuf
Couverture rigide
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Buch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology. N° de réf. du vendeur 9781643270005
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Quantum Metrology with Photoelectrons, Volume II: Applications and Advances (Iop Concise Physics)
Edité par
Iop Concise Physics, 2018
ISBN 10 : 1643270001
ISBN 13 : 9781643270005
Neuf
Couverture rigide
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