ESD Protection Methodologies: From Component to System - Couverture rigide

Bafleur, Marise; Caignet, Fabrice; Nolhier, Nicolas

9781785481222: ESD Protection Methodologies: From Component to System

Couverture rigide

ISBN 10 : 1785481223 ISBN 13 : 9781785481222

Editeur : ISTE Press Ltd - Elsevier Inc, 2017

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Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.

Les informations fournies dans la section � Synopsis � peuvent faire r�f�rence � une autre �dition de ce titre.

� propos des auteurs

Marise Bafleur is Research Director at the Laboratory for Analysis and Architecture of Systems (LAAS-CNRS) in Toulouse, France.

Fabrice Caignet is a Lecturer at Paul Sabatier University in Toulouse, France. .

Nicolas Nolhier is Professor in Electronics at Paul Sabatier University in Toulouse, France.

Les informations fournies dans la section � A propos du livre � peuvent faire r�f�rence � une autre �dition de ce titre.

�diteurISTE Press Ltd - Elsevier Inc
Date d'�dition2017
ISBN 10 1785481223
ISBN 13 9781785481222
ReliureReli�
Langueanglais
Nombre de pages284
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Esd Protection Methodologies

Marise Bafleur

Edit� par Elsevier Science Jul 2017, 2017

ISBN 10 : 1785481223 ISBN 13 : 9781785481222

Neuf Couverture rigide

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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne

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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level. 284 pp. Englisch. N� de r�f. du vendeur 9781785481222

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Esd Protection Methodologies : From Component to System

Marise Bafleur

Edit� par Elsevier Science, 2017

ISBN 10 : 1785481223 ISBN 13 : 9781785481222

Neuf Couverture rigide

impression � la demande

Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne

�valuation du vendeur 5 sur 5 �toiles

Buch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level. N� de r�f. du vendeur 9781785481222

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