Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation - Couverture rigide

Deshayes, Yannick

Couverture rigide

ISBN 10 : 1785481525 ISBN 13 : 9781785481529

Editeur : ISTE Press Ltd - Elsevier Inc, 2016

Synopsis

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

A propos du livre

À propos de l'auteur

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices.

Détails de l'édition

• Éditeur: ISTE Press Ltd - Elsevier Inc
• Date d'édition: 2016
• Langue: anglais
• ISBN 10: 1785481525
• ISBN 13: 9781785481529
• Reliure: Relié
• Nombre de pages: 172
• Coordonnées du fabricant: non disponible
• Personne responsable: Barbara Criscuolo; b.criscuolo@lswr.it; ; Via Spadolini, 7; Milano; 20141; Italie