Articles liés à Scanning Transmission Electron Microscopy of Nanomaterials:...

Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis - Couverture rigide

Tanaka, Nobuo

 
9781848167896: Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis
Couverture rigide
ISBN 10 : 184816789X ISBN 13 : 9781848167896
Editeur : Imperial College Press, 2014

Synopsis

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Imperial College Press
Date d'édition
2014
Langue
anglais
ISBN 10 
184816789X
ISBN 13 
9781848167896
Reliure
Relié
Nombre de pages
616
Coordonnées du fabricant
non disponible
Personne responsable
GPSR Kontakt
gpsr@libri.de

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