Nanocharacterisation - Couverture rigide

 
9781849738057: Nanocharacterisation

Synopsis

This new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods for nanostructured materials.

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À propos de l'auteur

A I Kirkland is Professor of Materials at Oxford University and the author of over 170 refereed papers. He was awarded "best materials paper" of 2005 by the Microscopy Society of America. Since 2000 he has also been involved in the characterisation of CCD cameras for TEM. His most recent work involves the development of approaches to complex phase extension and diffractive imaging to further improve resolution.

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