Burn-in testing (an alternative to ESS) is widely used as an aid in producing failure-free electronic components. When scientifically planned and conducted, burn-in-testing offers one of the most effective methods of reliability screening at the component level.
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When scientifically planned and conducted, burn-in testing offers one of the most effective methods of reliability screening at the component level. By testing individual elements under constant temperature stress, electrical stress, temperature cycling stress, or a combined thermal-electrical stress, burn-in testing can identify discrete faults that may be harder to perceive at the assembly, module, or system level.
This book covers all aspects of burn-in testing, from basic definitions to state-of-the-art concepts. Drawing on a broad database of studies, Burn-In Testing emphasizes mathematical and statistical models for quantifying the failure process, optimizing component reliability, and minimizing the total cost.
Vividly illustrated with figures, tables and charts, Burn-In Testing includes:
With each chapter, Burn-In Testing also offers the appropriate FORTRAN code for the processes described.
Burn-In Testing is ideal for practicing engineers in the fields of reliability, life testing, and product assurance. It is also useful for upper division and graduate students in these and related fields.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
hardcover. Etat : New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book. N° de réf. du vendeur ERICA82919320780616
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