Atomic Force Microscopy - Couverture souple

Voigtländer, Bert

Couverture souple

ISBN 10 : 3030136566 ISBN 13 : 9783030136567

Editeur : Springer, 2020

Synopsis

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

A propos du livre

À propos de l'auteur

Prof. Dr. rer. nat. Bert Voigtländer studied Physics at the University of Cologne and the RWTH Aachen University, earning his Ph.D. in 1989. While a postdoctoral researcher at the IBM Research Center in Yorktown Heights, USA, he began his current field of research using scanning probe microscopy. As a staff scientist at the Jülich Research Centre (Forschungszentrum Jülich), his recent focus has been nanoscale charge transport measurements. In 2012, he founded the spin-off company mProbes, which offers multi-tip scanning probe microscopes. To date, he has authored and co-authored over 100 peer-reviewed publications.

Détails de l'édition

• Éditeur: Springer
• Date d'édition: 2020
• Langue: anglais
• ISBN 10: 3030136566
• ISBN 13: 9783030136567
• Reliure: Broché
• Numéro d'édition: 2
• Nombre de pages: 348
• Coordonnées du fabricant: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Allemagne