This book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Basel Halak is the director of the Embedded Systems Master program at Southampton University. He is a member of the Sustainable Electronics Research group, as well as, Cyber Security group at Electronics and Computer Science School (ECS). He has written over 60 conference and journal papers, and authored two books. He has received his PhD degree in Microelectronics System Design from Newcastle University. He was then awarded a knowledge transfer fellowship to develop secure and energy efficient design for portable health care monitoring systems. His background is on the design and implementation of microelectronics systems, with special focus on developing secure hardware implementation for cryptographic primitives such as physically unclonable functions. Dr Halak lectures on digital design, Secure Hardware and Cryptography, supervises a number of MSc and PhD students, and leading the European Masters in Embedded Computing Systems (EMECS). He is the recipient of the Vice Chancellor Teaching Award in 2016, and the bronze leaf award in IEEE PRIME conference for his paper on current-based physically unclonable functions. He is a senior fellow of the Higher Education Academy (HEA), a guest editor of the IET CDT, and serves on several technical program committees such as IEEE ICCCA, ICCCS, MTV, IVSW, MicDAT and EWME. He is also member of hardware security working group of the World Wide Web Consortium (W3C).
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : Universitätsbuchhandlung Herta Hold GmbH, Berlin, Allemagne
XIII, 228 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch. N° de réf. du vendeur 9243GB
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Etat : new. Questo è un articolo print on demand. N° de réf. du vendeur 38bd9a2c38c1178c86d571309bf83018
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes ofthis phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. 244 pp. Englisch. N° de réf. du vendeur 9783030237806
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Describes in detail the physical mechanisms of CMOS ageingProvides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuitsPresents state-of-the art synthesis algorithms for ageing. N° de réf. du vendeur 448676242
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Buch. Etat : Neu. Neuware -This book provides comprehensive coverage of the latest research into integrated circuits¿ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 244 pp. Englisch. N° de réf. du vendeur 9783030237806
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