This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book presents the theoretical background of creating structure functions from the measured results with mathematical details. It then shows how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and calibrating simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The particular problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide bandgap materials, and LEDs, are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed tounderstand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Márta Rencz, Ph.D., is a Professor and former Head of the Department of Electron Devices at the Budapest University of Technology and Economics. Dr. Rencz also holds a Research Director position with Mentor, a Siemens Business. She received her undergraduate and master's degrees in electrical engineering and a Ph.D. from the Technical University of Budapest, Hungary, a Doctor of Science degree from The Hungarian Academy of Science, and a Doctor Honoris Causa degree from the Technical University of Tallinn. Her latest research interests include the thermal investigation of ICs and MEMS, thermal sensors, thermal testing, thermal simulation, multiphysics model generation, and electro-thermal simulation. Dr. Rencz received the Harvey Rosten Award of Excellence for her research results in thermal modeling and the ASME Allan Krauss Thermal Management Medal for her contributions to the scientific and academic world of thermal transient testing, in particular, her work on thermal metrology, including thermal test, characterization, and analysis of semiconductor devices and packages. She is a Program Committee member for several international conferences and workshops and a guest editor of special issues at leading scientific journals. She has published her theoretical and practical results in more than 350 technical papers.
Gábor Farkas, Ph.D., received his MSc in electrical engineering in 1976 and his Ph.D. in 1981 at the Budapest University of Technology and Economics, Hungary, specializing in technical physics. Since then, Dr. Farkas has worked in various fields of microelectronics, from device design to circuit testing. He was visiting scholar at several European universities. His current research focus is on testing high-power devices. He has published his research results in over 100 technical papers.Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : WeBuyBooks, Rossendale, LANCS, Royaume-Uni
Etat : Like New. Most items will be dispatched the same or the next working day. An apparently unread copy in perfect condition. Dust cover is intact with no nicks or tears. Spine has no signs of creasing. Pages are clean and not marred by notes or folds of any kind. N° de réf. du vendeur wbs9999085355
Quantité disponible : 1 disponible(s)
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Etat : As New. Unread book in perfect condition. N° de réf. du vendeur 46831440
Quantité disponible : Plus de 20 disponibles
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Etat : New. In. N° de réf. du vendeur ria9783030861766_new
Quantité disponible : Plus de 20 disponibles
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
Etat : New. N° de réf. du vendeur 46831440-n
Quantité disponible : Plus de 20 disponibles
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
Etat : New. N° de réf. du vendeur 46831440-n
Quantité disponible : Plus de 20 disponibles
Vendeur : Rarewaves.com USA, London, LONDO, Royaume-Uni
Paperback. Etat : New. 2022 ed. N° de réf. du vendeur LU-9783030861766
Quantité disponible : Plus de 20 disponibles
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
Etat : As New. Unread book in perfect condition. N° de réf. du vendeur 46831440
Quantité disponible : Plus de 20 disponibles
Vendeur : California Books, Miami, FL, Etats-Unis
Etat : New. N° de réf. du vendeur I-9783030861766
Quantité disponible : Plus de 20 disponibles
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book presents the theoretical background of creating structure functions from the measured results with mathematical details. It then shows how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and calibrating simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The particular problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide bandgap materials, and LEDs, are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed tounderstand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers. 396 pp. Englisch. N° de réf. du vendeur 9783030861766
Quantité disponible : 2 disponible(s)
Vendeur : Books Puddle, New York, NY, Etats-Unis
Etat : New. 1st ed. 2022 edition NO-PA16APR2015-KAP. N° de réf. du vendeur 26399310419
Quantité disponible : 4 disponible(s)