The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include, but are not limited to:
- Novel methods and techniques for characterizing materials across a spectrum of systems and processes.
- Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of materials.
- Characterization of structural, morphological, and topographical natures of materials at micro- and nano- scales.
- Characterization of extraction and processing including process development and analysis.
- Advances in instrument developments for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques.- 2D and 3D modelling for materials characterization.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Mingming Zhang, Wood Mackenzie; Jian Li, CanmetMATERIALS; Bowen Li, Michigan Technological University; Sergio N. Monteiro, Instituto Militar de Engenharia; Shadia Ikhmayies, Al Isra University; Yunus Eren Kalay, Middle East Technical University; Jiann-Yang Hwang, Michigan Technological University; Juan P. Escobedo-Diaz, University of New South Wales; John S. Carpenter, Los Alamos National Laboratory; Andrew D. Brown, DEVCOM U.S. Army Research Laboratory; Rajiv Soman, Eurofins EAG Materials Science LLC
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
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Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments ar. N° de réf. du vendeur 523473625
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include, but are not limited to:- Novel methods and techniques for characterizing materials across a spectrum of systems and processes.- Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of materials.- Characterization of structural, morphological, and topographical natures of materials at micro- and nano- scales.- Characterization of extraction and processing including process development and analysis.- Advances in instrument developments for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM,FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques.- 2D and 3D modelling for materials characterization. 512 pp. Englisch. N° de réf. du vendeur 9783030923723
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Buch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include, but are not limited to:¿ Novel methods and techniques for characterizing materials across a spectrum of systems and processes.¿ Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of materials.¿ Characterization of structural, morphological, and topographical natures of materials at micro- and nano- scales.¿ Characterization of extraction and processing including process development and analysis.¿ Advances in instrument developments for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM,FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques.¿ 2D and 3D modelling for materials characterization.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 512 pp. Englisch. N° de réf. du vendeur 9783030923723
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Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include, but are not limited to:- Novel methods and techniques for characterizing materials across a spectrum of systems and processes.- Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of materials.- Characterization of structural, morphological, and topographical natures of materials at micro- and nano- scales.- Characterization of extraction and processing including process development and analysis.- Advances in instrument developments for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM,FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques.- 2D and 3D modelling for materials characterization. N° de réf. du vendeur 9783030923723
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