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Single-Event Effects, from Space to Accelerator Environments: Analysis, Prediction and Hardening by Design - Couverture souple
Synopsis
This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.
Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.
- Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies
- Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies
- Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels
- Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context
This is an open access book.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
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Single-Event Effects, from Space to Accelerator Environments
Edité par
Springer, Berlin, CERN, Springer, 2025
ISBN 10 : 3031717252
ISBN 13 : 9783031717253
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologiesAddresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologiesReveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levelsOffers readers the first book in which particle accelerator applications will be extensively included in the radiation effects contextThis is an open access book. 141 pp. Englisch. N° de réf. du vendeur 9783031717253
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Single-Event Effects, from Space to Accelerator Environments
Edité par
Palgrave Macmillan Okt 2025, 2025
ISBN 10 : 3031717252
ISBN 13 : 9783031717253
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 152 pp. Englisch. N° de réf. du vendeur 9783031717253
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EUR 42,79
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Single-Event Effects, from Space to Accelerator Environments : Analysis, Prediction and Hardening by Design
impression à la demandeVendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologiesAddresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologiesReveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levelsOffers readers the first book in which particle accelerator applications will be extensively included in the radiation effects contextThis is an open access book. N° de réf. du vendeur 9783031717253
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EUR 42,79
Expédition à EUR 61,21
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Expédition depuis Allemagne vers Etats-Unis
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Single-Event Effects, from Space to Accelerator Environments | Analysis, Prediction and Hardening by Design
Vendeur : preigu, Osnabrück, Allemagne
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Taschenbuch. Etat : Neu. Single-Event Effects, from Space to Accelerator Environments | Analysis, Prediction and Hardening by Design | Ygor Quadros de Aguiar (u. a.) | Taschenbuch | x | Englisch | 2025 | Springer | EAN 9783031717253 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. N° de réf. du vendeur 136133068
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EUR 41,45
Expédition à EUR 70
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