Transmission Electron Microscopy Sample Preparation: From Specimen to Micrograph - Couverture rigide

Singh, Rajender

Couverture rigide

ISBN 10 : 3031829662 ISBN 13 : 9783031829666

Editeur : Springer International Publishing AG, 2025

Synopsis

This book is a thorough guide tailored for researchers, academics, and practitioners immersed in the intricate world of Transmission Electron Microscopy (TEM). It offers a seamless blend of theoretical understanding and practical insights, providing readers with the essential skills to navigate the complexities of TEM sample preparation for optimal imaging.

The book begins by introducing the basics of TEM operation, progressing to advanced modes, and dedicating significant attention to the nuances of sample preparation. Each chapter serves as a stepping stone, guiding readers from specimen selection to the acquisition of high-resolution micrographs. The motivation behind this book lies in addressing the practical challenges of TEM operation and sample preparation. The book bridges the gap between theory and application, offering a simplified yet scientific repository of dos and don’ts for achieving successful results in TEM sample preparation.

Within these pages, readers will explore various thinning techniques, delve into the preparation of nanomaterials and biological samples, and grasp the intricacies of cryo-TEM and in-situ TEM. Along with troubleshooting guidance to common pitfalls, the book also provides practical tips for overcoming challenges in the sample preparation process. The book also addresses the importance of properly prepared TEM samples, emphasizing the often-underestimated role they play in unlocking the full potential of TEM imaging. Real-world case studies showcase the impact of high-quality sample preparation across diverse research fields.

This book is not just an informative guide; it is a journey of transformation and enlightenment, empowering the reader with the confidence and expertise needed for precise sample preparation and quality imaging.

A propos du livre

À propos de l'auteur

Dr. Rajender Singh currently serves as a scientific officer in the Electron Microscopy Section at the Department of CIL/SAIF, Panjab University, Chandigarh, India. With nearly 13 years of experience in the field of electron microscopy, Dr. Singh is a seasoned expert in many facets of TEM sample preparation. His role involves analyzing diverse samples from material science and life science areas across India, utilizing cutting-edge instruments such as TEM (H7500, 120KV), HRTEM with SAED, EDS (Oxford), and FESEM with EDS (Hitachi SU8010). Dr. Singh is not only responsible for the operation of sophisticated instruments but also leads training modules for students at various academic levels, focusing on TEM, HRTEM, SEM, FESEM, ultramicrotome, and Critical Point Dryer (CPD) instruments.

His technical skills span handling HRTEM JEOL 2100 Plus independently, performing maintenance for various TEM models, and interpreting STEM bright field and dark field imaging.

Détails de l'édition

• Éditeur: Springer International Publishing AG
• Date d'édition: 2025
• Langue: anglais
• ISBN 10: 3031829662
• ISBN 13: 9783031829666
• Reliure: Relié
• Nombre de pages: 341
• Coordonnées du fabricant: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Allemagne