Parameter-centric Scaled Fet Devices: Physics Based Perspectives and Attributes - Couverture rigide

Ashraf, Nabil Shovon

Couverture rigide

ISBN 10 : 3031842855 ISBN 13 : 9783031842856

Editeur : Springer International Publishing AG, 2025

Synopsis

Parameters that determine the performance of silicon-based Field Effect Transistors (FET) devices in the presence of degenerate doping, often are not modeled properly and so require precise analysis to improve modeling accuracy. The book is focused on the extraction of parameters for silicon-based FET models that critically determine the FET performance at room temperature as well as at very low temperatures. Emphasize is put on analysis that is based on the device physics, especially at low (cryogenic) temperatures. Performance of gate-all-around (GAA) nanowire FETs, and stacked nanosheet complementary FETs (C-FET) are also discussed.

A propos du livre

À propos de l'auteur

Dr. Nabil Shovon Ashraf was born on 10th of August 1974 in Dhaka, Bangladesh and grew up in Dhaka, Bangladesh. He obtained B.Tech in electrical engineering from IIT Kanpur India in May 1997, M.S. degree from the University of Central Florida, Orlando, Florida, USA in August 1999 in Electrical Engineering, and PhD degree from the Electrical Engineering Department of Arizona State University, Tempe, Arizona, USA in December 2011. He was a post-doctoral researcher at Arizona State University Electrical Engineering Department between 2011 and 2014. From August 1999 to March 2001, he was employed as a SAW filter design engineer in RF Monolithic Inc, Dallas, Texas, USA.

He served in various universities in Dhaka, Bangladesh as an Electrical and Electronic Engineering faculty from 2002 to 2006. After returning to Dhaka, Bangladesh in February 2014 after completion of Post Doctoral work, he served as Assistant Professor from September 2014 and then Associate Professor from April 2018 in the ECE department of North South University, Dhaka, Bangladesh until May 2022. Presently, he conducts independent research in the field of semiconductor device scaling, modeling, and device physics study of advanced FET architectures.

He authored two books that were published by Morgan & Claypool in 2016 and 2018. These books are currently available from Springer Nature. To-date, he has also authored eight journals and about 15 conference papers along with eight book Chapters. He was also the recipients of Albert Nelson Marquis Lifetime Achievement Award in 2017, listed in the 69th edition and the 70th platinum edition of author biographees in Marquis Who's Who in America publications.

Détails de l'édition

• Éditeur: Springer International Publishing AG
• Date d'édition: 2025
• Langue: anglais
• ISBN 10: 3031842855
• ISBN 13: 9783031842856
• Reliure: Relié
• Nombre de pages: 149
• Coordonnées du fabricant: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Allemagne