Reliability of CMOS Analog ICs - Couverture souple

Kuntman, Hakan; Özenli, Deniz; Kaçar, Fırat; Özçelep, Yasin

Couverture souple

ISBN 10 : 3031854578 ISBN 13 : 9783031854576

Editeur : Springer, 2026

Synopsis

This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications.

Détails de l'édition

• Éditeur: Springer
• Date d'édition: 2026
• Langue: anglais
• ISBN 10: 3031854578
• ISBN 13: 9783031854576
• Reliure: Broché
• Nombre de pages: 108
• Coordonnées du fabricant: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Allemagne