This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and advanced machine‑learning‑driven approaches. It first examines multiple reinforcement‑learning‑based strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deep‑learning‑assisted approach that leverages ANN‑based performance regressors, transfer learning, and adaptive refinement to accelerate simulation‑driven optimization without requiring extensive corner‑specific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Pedro Paiva received a B.Sc. degree in Electrical and Computer Engineering from the Instituto Superior Técnico (IST), University of Lisbon, Portugal, in 2023. He is currently completing his M.Sc. degree in the field of control, robotics, and artificial intelligence at the same institution, with his thesis focusing on electronic design automation of analog integrated circuits. His research interests include machine learning and deep learning.
José Costa received a B.Sc. degree in Electrical and Computer Engineering from the Instituto Superior Técnico (IST), University of Lisbon, Portugal, in 2025. His research interests include machine learning and deep learning.
Filipe Azevedo received his M.Sc. degree in Computer Science and Engineering from the Instituto Superior Técnico (IST), University of Lisbon, Portugal, in 2020. He is currently working on his Ph.D. degree in Electrical and Computer Engineering from the same university, while working with Instituto de Telecomunicações. His research interests include machine learning and generative AI applied to analog IC design automation.
Ricardo Martins received the Ph.D. degree in Electrical and Computer Engineering from Instituto Superior Técnico―University of Lisbon (IST-UL), Portugal, in 2015. He is with Instituto de Telecomunicações since 2011 developing electronic design automation tools and in 2022 became Assistant Professor of the electronics scientific area of the Department of Electrical and Computer Engineering of IST-UL.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : Grand Eagle Retail, Bensenville, IL, Etats-Unis
Paperback. Etat : new. Paperback. This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and advanced machinelearningdriven approaches. It first examines multiple reinforcementlearningbased strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deeplearningassisted approach that leverages ANNbased performance regressors, transfer learning, and adaptive refinement to accelerate simulationdriven optimization without requiring extensive cornerspecific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N° de réf. du vendeur 9783032194084
Quantité disponible : 1 disponible(s)
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and advanced machine learning driven approaches. It first examines multiple reinforcement learning based strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deep learning assisted approach that leverages ANN based performance regressors, transfer learning, and adaptive refinement to accelerate simulation driven optimization without requiring extensive corner specific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design. 91 pp. Englisch. N° de réf. du vendeur 9783032194084
Quantité disponible : 2 disponible(s)
Vendeur : Books Puddle, New York, NY, Etats-Unis
Etat : New. N° de réf. du vendeur 26405520044
Quantité disponible : 4 disponible(s)
Vendeur : Revaluation Books, Exeter, Royaume-Uni
Paperback. Etat : Brand New. 103 pages. 6.10x0.24x9.25 inches. In Stock. N° de réf. du vendeur x-3032194083
Quantité disponible : 1 disponible(s)
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
Etat : New. PRINT ON DEMAND. N° de réf. du vendeur 18405520038
Quantité disponible : 4 disponible(s)
Vendeur : Majestic Books, Hounslow, Royaume-Uni
Etat : New. Print on Demand. N° de réf. du vendeur 408682867
Quantité disponible : 4 disponible(s)
Vendeur : moluna, Greven, Allemagne
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. N° de réf. du vendeur 2871031617
Quantité disponible : Plus de 20 disponibles
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and advanced machinelearningdriven approaches. It first examines multiple reinforcementlearningbased strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deeplearningassisted approach that leverages ANNbased performance regressors, transfer learning, and adaptive refinement to accelerate simulationdriven optimization without requiring extensive cornerspecific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 104 pp. Englisch. N° de réf. du vendeur 9783032194084
Quantité disponible : 1 disponible(s)
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and advanced machine learning driven approaches. It first examines multiple reinforcement learning based strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deep learning assisted approach that leverages ANN based performance regressors, transfer learning, and adaptive refinement to accelerate simulation driven optimization without requiring extensive corner specific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design. N° de réf. du vendeur 9783032194084
Quantité disponible : 1 disponible(s)