Polymer Surface Characterization provides a comprehensive approach to the surface analysis of polymers of technological interest by means of modern analytical techniques. Basic principles, operative conditions, applications, performance, and limiting features are supplied, together with current advances in instrumental apparatus. Each chapter is devoted to one technique and is self-consistent; the end-of-chapter references would allow the reader a quick access to more detailed information.
After an introductory chapter, techniques that can interrogate the very shallow depth of a polymer surface, spanning from the top few angstroms in secondary ions mass spectrometry to 2-10 nm in X-ray photoelectron spectroscopy are discussed, followed by Fourier transform infrared spectroscopy and chapters on characterization by scanning probe microscopy, electron microscopies, wettability and spectroscopic ellipsometry.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Luigia Sabbatini, Universita degli Studii di Bari Aldo Moro, Bari, Italy.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Polymer Surface Characterization provides a comprehensive approach to the surface analysis of polymers of technological interest by means of modern analytical techniques. Basic principles, operative conditions, applications, performance, and limiting features are supplied, together with current advances in instrumental apparatus. Each chapter is devoted to one technique and is self-consistent; the end-of-chapter references would allow the reader a quick access to more detailed information.After an introductory chapter, techniques that can interrogate the very shallow depth of a polymer surface, spanning from the top few angstroms in secondary ions mass spectrometry to 2-10 nm in X-ray photoelectron spectroscopy are discussed, followed by Fourier transform infrared spectroscopy and chapters on characterization by scanning probe microscopy, electron microscopies, wettability and spectroscopic ellipsometry. 308 pp. Englisch. N° de réf. du vendeur 9783110275087
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Luigia Sabbatini, Uni. N° de réf. du vendeur 151202726
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Buch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides a comprehensive approach to the surface analysis of polymers of technological interest by means of modern analytical techniques. Case studies are critically discussed by experts in the field. This book is aimed at graduate students but also at newcomers to the field of surface characterization and chemical analysis but also generally interested in polymeric materials. 308 pp. Englisch. N° de réf. du vendeur 9783110275087
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Buch. Etat : Neu. Polymer Surface Characterization | Luigia Sabbatini | Buch | Englisch | 2014 | De Gruyter | EAN 9783110275087 | Verantwortliche Person für die EU: Walter de Gruyter, Genthiner Str. 13, 10785 Berlin, productsafety[at]degruyterbrill[dot]com | Anbieter: preigu Print on Demand. N° de réf. du vendeur 111817827
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Polymer Surface Characterization provides a comprehensive approach to the surface analysis of polymers of technological interest by means of modern analytical techniques. Basic principles, operative conditions, applications, performance, and limiting features are supplied, together with current advances in instrumental apparatus. Each chapter is devoted to one technique and is self-consistent; the end-of-chapter references would allow the reader a quick access to more detailed information.After an introductory chapter, techniques that can interrogate the very shallow depth of a polymer surface, spanning from the top few angstroms in secondary ions mass spectrometry to 2-10 nm in X-ray photoelectron spectroscopy are discussed, followed by Fourier transform infrared spectroscopy and chapters on characterization by scanning probe microscopy, electron microscopies, wettability and spectroscopic ellipsometry. N° de réf. du vendeur 9783110275087
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Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
Paperback. Etat : Like New. Like New. Ships from Multiple Locations. book. N° de réf. du vendeur ERICA77531102750826
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